Board diagnostic using ABI IC Tester, replace BGA Chip using PDR Rework Station, and IC being re-program using Xeltek Atmel Avr Programmer

 

 

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ABI Electronics - SYSTEM 8 Advanced Test Module

 

The Advanced Test Module (ATM) is a solution that offers high test capabilities and comprehensive fault diagnosis with a high degree of flexibility. Powerful test combinations ensure the best fault coverage on PCBs or components and include functional, connections, voltage, thermal and V-I signature tests.

A sophisticated but easy to use system with minimum user input required ensures that components and PCBs are tested efficiently and faults are detected rapidly.

 

System 8 ATM Key Features:

 

  • Library driven, in-circuit component testing
  • Board level functional testing
  • Automatic test sequences
  • Logging and reporting facilities

 

System 8 ATM Proven Benefits

 

  • Reduce fault-finding time by testing in-circuit with no schematics
  • Become self-dependent for all test and repair needs
  • Introduce board level testing capabilities into your business
  • Increase reliability by testing at component and board level
  • Lower capital expenditure with one solution for all applications
  • Improve data traceability and integration of your setup
  • Reduce setup times by using a practical software

 

Innovative solution for well known problems

 

  • Manufacturing defects

    These are faults such as dry joints, solder bridges or broken tracks. Even the most rigorous test of an IC is of no use if the fault is a broken track leading to an IC input. The IC passes but the board still does not work.

    The Advanced Test Module uses a combination of connection, voltage and V-I tests to identify any discrepancies in the wiring of a component. A high level of confidence can therefore be achieved, especially when the results are compared with a known good board or saved results.

  • Faulty components

    These problems include faulty ICs, shorted diodes or open resistors. Even if a component is correctly linked to the rest of the components, the board will still fail if this component does not functionally work.

    The Advanced Test Module uses a unique and established technique to functionally test devices in-circuit "as-wired". Because an IC may be configured in several different ways, the system can detect how the IC is wired and automatically adapt the test vectors to suit.

  • In-Circuit Functional Tester

    The ATM offers the most complete set of test methods to ensure components are assessed thoroughly and potential faults are identified quickly. The extensive library of components makes in-circuit testing easy by simply entering the part number of the device under test (DUT). The following tests are selectable with the ATM :

    1. Functional, checks that the device is working as per the datasheet
    2. Connection, checks the way the component is wired in-circuit
    3. Voltage, checks the voltage on each pin of the device
    4. Thermal, checks the relative temperature of the component
    5. VI, checks the internal structure of the device

    The ATM is suitable for all logic families including TTL, CMOS, LVTTL, ECL, DTL, LSI, RTL, PECL, LVPECL.

  • Out-Of-Circuit Functional Test
  • Use the out-of-circuit adapter to isolate the component and to run tests outside the board environment. This is useful to further diagnose a suspect device, to remove the influence of other components or to check a new device before it is placed in-circuit.

 

Established technique in commercial and military applications

 

One of the most widely used techniques of fault-finding is to use a known good board as reference to compare the results with a suspect board. The SYSTEM 8 Premier software offers this capability by temporarily or permanently saving the results of any test(s) and automatically comparing them. Differences and potential faults are highlighted down to pin or contact level, making the detection easier and quicker. This technique is widely used throughout ABI's range of customers.

 

  • Board Level Tester

    The graphical test generator is the easiest way to create test patterns for individual devices and complete PCB assemblies. Each channel of the ATM can be individually selected to be an input, an output or both (bidirectional). A logic pattern (test vector) can quickly be generated with the use of the mouse.

    The output response of the unit under test can be learnt automatically or compared with preset vectors. The patterns and responses can be saved in the software for repetitive use (production environment) or when a similar board is received (repair shop).

  • PCB vs Component Testing

    An IC is a device which, usually, has several input, output and power pins with a core logic designed to carry out particular functions. A PCB assembly, usually made up of several ICs, offers connectors with input, output and power connection and is designed to run specific functions.

    The Advanced Test Module is equally at ease with testing large quantities of boards (production testing) and testing in-circuit single components (repair and diagnostics).

  • TestFlows & Reports

    In order to automate the test procedure and to make testing accessible to inexperienced staff, the SYSTEM 8 Premier offers the option to write and run test sequences, known as TestFlows. These TestFlows are easily generated and record the master data, all the test parameters and the windows layouts in order to keep the procedure as user friendly as possible.

    Traceability of information is key to highlighting trends. For instance, repetitive failures of PCB assemblies through a TestFlow may point to a manufacturing defect whilst a board that keeps coming back for repair for the same fault might highlight a design.

 

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