Board diagnostic using ABI IC Tester, replace BGA Chip using PDR Rework Station, and IC being re-program using Xeltek Atmel Avr Programmer

 

 

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ABI Electronics - LMCP - CMCP

Analogue and Digital Handheld IC Testing

 

The Compact Professional Range offers easy to use out of circuit IC testing with an optional programming facility. Simply plug in the device, key in its number and the unit will do the rest. Proven test software using advanced technology makes the units ideal additions to your toolkit.

 

  • Simple operation
  • Extensive built-in library
  • Unknown device identification
  • Optional programming facility (CompactLink)
  • Optional SOIC and PLCC adapter
  • Diagnostic information for individual pins
  • Conditional loop testing mode
  • Comprehensive tests
  • RS 232 connector
  • Battery operated
  • Mains adapter available

 

Handheld Analogue and Digital IC Tester

For DIL, SOIC and PLCC devices

 

State of the Art Technology

Very large scale integration allows advanced functionality and ease of use to be combined in the Compact Professional Range's hand-held, battery operated units. The 2 line x 16 character dot matrix LCD shows the result of the test as a 'PASS' or 'FAIL' together with individual device pin diagnostics, test mode and possible equivalents.

 

Extensive Built-in Test Libraries
The LinearMaster Compact Professional includes all common analogue ICs including op-amps, comparators, voltage regulators, voltage references, analogue switches & multiplexers, optoisolators & couplers and audio ICs. The ChipMaster Compact Professional includes a broad range of TTL, CMOS, memory, LSI, interface and other devices of up to 40 pins.

 

LinearMaster Compact Professional (LMCP)

HANDHELD ANALOGUE IC TESTER

 

Comprehensive Test

The LinearMaster Compact Professional emulates passive circuitry around the device under test to ensure that a comprehensive test takes place. High integrity verification offers guaranteed levels of reliability in the results. Conditional and unconditional loop testing modes ensure that intermittent and/or temperature related faults are detected.

 

Auto Identification

The LinearMaster Compact Professional automatically senses the functionality of the device to be tested and displays a list of possible equivalents for replacement. Unmarked and house-coded ICs are easily identified and tested. As part of the IC test, the specific IC number, the functional description of the device and the status of faulty pins are scrolled through on the built-in display.

 

  • Auto identification mode identifies unmarked/house-coded devices listing possible replacements
  • Conditional/unconditional loop testing mode
  • Functional test unit emulates passive circuitry to implement a comprehensive test in a variety of configurations and gain settings
  • Displays diagnostic information down to individual component pins
  • Rugged, hand-held, ergonomically designed case incorporates built-in membrane keypad, 2 x 16 dot matrix alphanumeric LCD and high quality 16 pin ZIF socket
  • Battery operated (4 x AA) with low power design, auto power-down function
  • Mains adapter available

 

ChipMaster Compact Professional (CMCP)

HANDHELD DIGITAL IC TESTER

 

Intermittent Fault Detection

The ChipMaster Compact Professional is able to locate intermittent and temperature related faults by using its unconditional or conditional loop testing modes, saving hours of valuable time.

 

Unknown Device Identification

By simply selecting 'Search' from the menu, selecting the number of pins on the device and activating Search Mode the Chipmaster Compact Professional will search its library and identify the device, displaying possible functional equivalents for replacement.

 

As part of the IC test, the specific IC number, the functional description of the device and the status of faulty pins are scrolled through on the built-in display.

 

  • Comprehensive device library covers almost all TTL, CMOS, Memory and Interface devices
  • 40 pin capability (NAND gates to CPUs)
  • Identifies unmarked and house-coded devices
  • Detects intermittent and temperature related faults
  • Displays diagnostic information for individual pins
  • Battery operated (4 x AA) with low power design, auto power-down function
  • Mains adapter available

 

CompactLink (optional)

Functional IC test generating software for Compact Professional Range

A PC based software package that allows users to add new devices to the library and create functional tests to suit special applications. CompactLink uses PremierLink IC Programming (PLIP), a high-level descriptive test programming language optimised for generation of both analogue and digital IC tests programmes. Connection to PC via RS-232 or USB (adapter supplied).

 

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Contact PT. Inti Instrumen Jaya to discuss your requirements.

 

 

 

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